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This test method can be used with any light beam regardless of the contrast of the light beam
8-0698 (Reapproved 0706)
etched or passivated
The artifacts described in this Guide are intended to parallel and support the content of the specification form for order entry in SEMI M1
1 This Specification describes a method for data acquisition EDA Applications to request process and data from equipment to be communicated in an automated fashion by the equipment
T01900 - SEMI T19 - Specification for Device Marking Revision:SEMI T19-0311 (Reapproved 0717) - Superseded This test method can beThe purpose of this Standard is to establish a standard specification of marking on semiconductor devices to identify individual device by unique identification code and possible optional information to suggest a part of manufacturing information. This Specification ranges from bare semiconductor dice to be packaged or assembled devices. While this Standard specifies physical interface of marking depending on one or more available technologies, it
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